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The Impact 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results. More details at the manufacturers site: http:// /7BT.htm This system was purchased new for $55,000 in 2006. (this posting is the responsibility of the poster) |
jguthrie@dfwind.com (Johnny Guthrie) for more information. All emails will be forwarded to the poster's actual email address.
